This document presents a novel hybrid intelligent method for automatic recognition of control chart patterns (CCPs) in manufacturing processes, combining a modified imperialist competitive algorithm (MICA) with k-means for effective clustering. It includes two main modules: clustering, which identifies patterns based on computed Euclidean distances, and classifying through various neural network models to achieve approximately 99.65% recognition accuracy. The paper discusses the structure, methods, and effectiveness of this approach in improving the analysis of control charts.