Add missing unsafe qualifier on 1-bit enumerated fields #173
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E.g. this from tm4c123x.svd generated by dslite2svd: <field> <name>VREF</name> <description>Voltage Reference Select</description> <lsb>0</lsb> <msb>0</msb> <access>read-write</access> <writeConstraint> <useEnumeratedValues>true</useEnumeratedValues> </writeConstraint> <enumeratedValues> <enumeratedValue> <name>INTERNAL</name> <description>VDDA and GNDA are the voltage references</description> <value>0x0</value> </enumeratedValue> </enumeratedValues> </field>
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| Thanks, @whitequark @homunkulus r+ |
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| 📌 Commit bac9703 has been approved by |
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japaric pushed a commit that referenced this pull request Feb 13, 2018
Add missing unsafe qualifier on 1-bit enumerated fields E.g. this from tm4c123x.svd generated by dslite2svd: ``` <field> <name>VREF</name> <description>Voltage Reference Select</description> <lsb>0</lsb> <msb>0</msb> <access>read-write</access> <writeConstraint> <useEnumeratedValues>true</useEnumeratedValues> </writeConstraint> <enumeratedValues> <enumeratedValue> <name>INTERNAL</name> <description>VDDA and GNDA are the voltage references</description> <value>0x0</value> </enumeratedValue> </enumeratedValues> </field> ```
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| 💔 Test failed - status-travis |
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| The build timed out due to an out of memory condition caused by incremental compilation, which is now enabled by default, and the test suite reusing the same crate (directory) to test different devices. I have tested locally (with incr. comp. disabled) that the test suite passes for the vendors that Travis couldn't test; though it seems that testing time has regressed significantly in some cases due to some other reason: testing the Freescale vendor locally took 1h 47m, which is beyond Travis time limit. Anyhow, I'm merging this manually as all the tests have passed. |
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E.g. this from tm4c123x.svd generated by dslite2svd: